X-ray Crystallographic Center (XCC)

Department of Chemistry & Biochemistry
1526 Chemistry Building (Wing 5)
8051 Regents Drive
University of Maryland
College Park, Maryland 20742-4454

See MAP for directions to XCC.
 

Services and resources as well as training and education for students and researchers in the theory and practice of X-ray Diffraction, Chemical Crystallography and Materials Characterization.

State-of-the-Art X-ray Diffraction Facilities; Quality Service and Competitive Rates; Experience & Expertise in filed of Crystallography and Diffraction, Solid State and Materials Chemistry, Pharmaceuticals and other.

Characterization of materials using non-destructive X-ray diffraction analysis and crystal structure determination from single crystal and polycrystalline (powder) samples at low, ambient or elevated temperature, in open or inert atmosphere.

Monday through Friday; from 9 AM to 5 PM (office hours from 1pm to 3pm)

Chemical Crystallography: provides single crystal structure determination of variety of inorganic, metal-organic, organic and pharmaceutical compounds, minerals and intermetallics, including absolute structure determination, treatment of mero- and non-merohedral twins, disordered, OD and modulated crystals. New addition of D8Venture system allows also screening of the protein crystals and cooling crystals down to 20K.

Materials Characterization: provides powder X-ray diffraction analysis and characterization of polycrystalline and nano-crystalline materials and thin films, covering phase identification, qualitative and quantitative analysis, amorphous content determination, micro-diffraction and area mapping, samples of any size and shape, crystallite size and micro-strain determination, ab initio indexing and accurate unit cell refinement, crystal structure refinement using the Rietveld method and ab initio structure determination

Advanced Diffraction: provides X-ray diffraction measurements of the reflectivity (XRR) and pole figures from thin films; small angle X-ray scattering (SAXS) from polymers, nanomaterials and macromolecular compounds; X-ray back scattering diffraction (LAUE) for determination of the single crystal orientation.
 

• Bruker D8Venture Duo (Mo and Cu radiation, Photon III detector with variable crystal to detector distance, N-Helix with temp.  range from 20 to 310 K) – see Fig. 1
• Photonics Laue back scattering system for crystals evaluation and orientation – see Fig. 2
• Bruker D8 Advance powder diffractometer
  (Cu radiation, 9 position sample changer, 1D position sensitive detector, spinning)
• Bruker C2/D8 Discover powder diffractometer
  (Cu radiation, XYZ stage, 2D high res. detector, sample of variable size and shape)
• PANalytical X'pert Pro MRD diffractometer for reflectivity measurement
  (Cu radiation, 4 circle goniometer, parallel beam mirror, low angles > 0.2 deg.)
• Xenocs Xeuss system for small angle (SAXS) and wide angle (WAXS) X-ray scattering with variable (up to 2.5 m) sample to detector distance equipped with Cu radiation and vacuum and inert gas chamber and low/high temp. stage
   

Submission page at the XCC center

Peter Y. Zavalij
091 Chemistry Building, Room B0108,
University of Maryland, College Park, MD 20742
Contact Email: PZavalij@umd.edu
Contact Phone: (301) 405-1861