X-ray Crystallographic Center (XCC)
91 Chemistry Bldg.,
Rooms B0112 & B0108,
University of Maryland,
College Park, MD 20742
X-ray Crystallographic Center provides:
Services and resources as well as training and education for students and researchers in the theory and practice of X-ray Diffraction, Chemical Crystallography and Materials Characterization.
The XCC offers:
State-of-the-Art X-ray Diffraction Facilities; Quality Service and Competitive Rates; Experience & Expertise in filed of Crystallography and Diffraction, Solid State and Materials Chemistry, Pharmaceuticals and other.
The Center performs:
Characterization of materials using non-destructive X-ray diffraction analysis and crystal structure determination from single crystal and polycrystalline (powder) samples at low, ambient or elevated temperature, in open or inert atmosphere.
Hours of Operation
Monday through Friday; from 9 AM to 5 PM (office hours from 1pm to 3pm)
Services and Technologies Offered
Chemical Crystallography: provides single crystal structure determination of variety of inorganic, metal-organic, organic and pharmaceutical compounds, minerals and intermetallics, including including absolute structure determination, treatment of mero- and non-merohedral twins, disordered, OD and modulated crystals.
Materials Characterization: provides powder X-ray diffraction analysis and characterization of polycrystalline and nano-crystalline materials and thin films, covering phase identification, qualitative and quantitative analysis, amorphous content determination, micro-diffraction and area mapping, samples of any size and shape, crystallite size and micro-strain determination, ab initio indexing and accurate unit cell refinement, crystal structure refinement using the Rietveld method and ab initio structure determination
Advanced Diffraction: provides X-ray diffraction measurements for reflectivity (XRR) from thin films and (coming soon) small angle x-ray scattering (SAXS) from nano and macromolecular materials.
- Bruker Apex2 single crystal diffractometer
(Mo radiation, detector to crystal distance from 4 to 15 cm, temp. range 80 to 400K)
- Bruker D8 Advance powder diffractometer
(Cu radiation, 9 position sample changer, 1D position sensitive detector, spinning)
- Bruker C2/D8 Discover powder diffractometer
(Cu radiation, XYZ stage, 2D high res. detector, sample of variable size and shape)
- PANalytical X'pert Pro MRD diffractometer for reflectivity measurement
(Cu radiation, 4 circle goniometer, parallel beam mirror, low angles > 0.2 deg.)
- Xenocs Xeuss system for small angle scattering (coming soon)
Submission page at the XCC center
Peter Y. Zavalij
091 Chemistry Building, Room B0108,
University of Maryland, College Park, MD 20742
Contact Email: PZavalij@umd.edu
Contact Phone: (301) 405-1861