X-ray Crystallographic Center (XCC)

Facility Location

91 Chemistry Bldg., Rooms B0112 & B0108, University of Maryland, College Park, MD 20742

Brief Mission

X-ray Crystallographic Center provides:
services and resources as well as training and education for students and researchers
in the theory and practice of X-ray Diffraction, Chemical Crystallography and Materials
The XCC offers:
State-of-the-Art X-ray Diffraction Facilities; Quality Service and Competitive Rates; 
Experience & Expertise in filed of Crystallography and Diffraction, Solid State and
Materials Chemistry, Pharmaceuticals and other.
The Center performs:
Characterization of materials using non-destructive X-ray diffraction analysis and
crystal structure determination from single crystal and polycrystalline (powder)
samples at low, ambient or elevated temperature, in open or inert atmosphere.

Hours of Operation

Mon.-Fri. from 9 am to 5 pm (office hours from 1pm to 3pm)

Services and Technologies Offered

Chemical Crystallography: provides single crystal structure determination of variety
of inorganic, metal-organic, organic and pharmaceutical compounds, minerals and
intermetallics, including including absolute structure determination, treatment of mero-
and non-merohedral twins, disordered, OD and modulated crystals.
Materials Characterization: provides powder X-ray diffraction analysis and characteri-
zation of polycrystalline and nano-crystalline materials and thin films, covering phase 
identification, qualitative and quantitative analysis, amorphous content determination,
micro-diffraction and area mapping, samples of any size and shape, crystallite size and
micro-strain determination, ab initio indexing and accurate unit cell refinement, crystal
structure refinement using the Rietveld method and ab initio structure determination
Advanced Diffraction: provides X-ray diffraction measurements for reflectivity (XRR)
from thin films and (coming soon) small angle x-ray scattering (SAXS) from nano and 
macromolecular materials.

Equipment Available

  1. Bruker Apex2 single crystal diffractometer
    (Mo radiation, detector to crystal distance from 4 to 15 cm, temp. range 80 to 400K)
  2. Bruker D8 Advance powder diffractometer
    (Cu radiation, 9 position sample changer, 1D position sensitive detector, spinning)
  3. Bruker C2/D8 Discover powder diffractometer
    (Cu radiation, XYZ stage, 2D high res. detector, sample of variable size and shape)
  4. PANalytical X'pert Pro MRD diffractometer for reflectivity measurement
    (Cu radiation, 4 circle goniometer, parallel beam mirror, low angles > 0.2 deg.)
  5. Xenocs Xeuss system for small angle scattering (coming soon)


Peter Y. Zavalij
091 Chemistry Building, Room B0108, University of Maryland, College Park, MD 20742
Contact Phone: 
(301) 405-1861
Contact Email: 


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Division of Research
University of Maryland
College Park, MD 20742-1541

Email: vpr@umd.edu
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